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DuMond analysis of bending in single crystals by Laue diffraction using σ–π polarization geometry
Author(s) -
Serrano Jorge,
Ferrero Claudio,
Servidori Marco,
Härtwig Jürgen,
Krisch Michael
Publication year - 2008
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889808029981
Subject(s) - bent molecular geometry , analyser , monochromator , optics , geometry , diffraction , radius of curvature , polarization (electrochemistry) , curvature , bragg's law , bending , reflection (computer programming) , crystal (programming language) , materials science , physics , chemistry , mathematics , mean curvature , wavelength , mean curvature flow , computer science , composite material , programming language
A DuMond analysis of X‐ray diffraction patterns has been carried out in the case of a combined σ–π polarization configuration, obtained using a setup with a double‐crystal monochromator in reflection (Bragg) geometry and an analyser in transmission (Laue) geometry. The derived analytical expressions allow the characterization of the bending of the analyser and the quantitative estimation of the curvature radius and its sign from the width of the crystal rocking curves. The theoretical analysis is applied to the case of a thin, accidentally bent, Si crystal.