Premium
X‐ray powder diffraction quantitative analysis of an amorphous SiO 2 –poly(methyl methacrylate) nanocomposite
Author(s) -
Riello P.,
Munarin M.,
Silvestrini S.,
Moretti E.,
Storaro L.
Publication year - 2008
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889808029944
Subject(s) - amorphous solid , nanocomposite , materials science , methyl methacrylate , thermogravimetric analysis , poly(methyl methacrylate) , diffraction , polymerization , chemical engineering , methacrylate , composite material , polymer , organic chemistry , chemistry , optics , physics , engineering
Quantification of individual phases within a multiphase amorphous material has been achieved using a newly developed technique based on X‐ray powder diffraction. The quantification method was developed during a study of an amorphous silica–poly(methyl methacrylate) (SiO 2 –PMMA) hybrid nanocomposite. The efficiency of the method as a quantifying tool for individual phases was demonstrated for samples of SiO 2 –PMMA prepared either by polymerization of methyl methacrylate in the presence of amorphous SiO 2 or by mechanically mixing known quantities of the individual and pre‐prepared SiO 2 and PMMA materials. The weight percentages of amorphous SiO 2 in the nanocomposites as determined by application of the new technique were analogously found to be 29%, a result that was supported by thermogravimetric analysis and helium picnometry measurements.