X‐ray powder diffraction quantitative analysis of an amorphous SiO 2 –poly(methyl methacrylate) nanocomposite | Zendy

Riello P. | Zendy; Munarin M. | Zendy; Silvestrini S. | Zendy; Moretti E. | Zendy; Storaro L. | Zendy

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X‐ray powder diffraction quantitative analysis of an amorphous SiO 2 –poly(methyl methacrylate) nanocomposite

Author(s) -

Riello P.,

Munarin M.,

Silvestrini S.,

Moretti E.,

Storaro L.

Publication year - 2008

Publication title -

journal of applied crystallography

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.429

H-Index - 162

ISSN - 1600-5767

DOI - 10.1107/s0021889808029944

Subject(s) - amorphous solid , nanocomposite , materials science , methyl methacrylate , thermogravimetric analysis , poly(methyl methacrylate) , diffraction , polymerization , chemical engineering , methacrylate , composite material , polymer , organic chemistry , chemistry , optics , physics , engineering

Quantification of individual phases within a multiphase amorphous material has been achieved using a newly developed technique based on X‐ray powder diffraction. The quantification method was developed during a study of an amorphous silica–poly(methyl methacrylate) (SiO 2 –PMMA) hybrid nanocomposite. The efficiency of the method as a quantifying tool for individual phases was demonstrated for samples of SiO 2 –PMMA prepared either by polymerization of methyl methacrylate in the presence of amorphous SiO 2 or by mechanically mixing known quantities of the individual and pre‐prepared SiO 2 and PMMA materials. The weight percentages of amorphous SiO 2 in the nanocomposites as determined by application of the new technique were analogously found to be 29%, a result that was supported by thermogravimetric analysis and helium picnometry measurements.

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