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Fast and easy Bragg reflex search for Berg–Barrett topography of misoriented crystals
Author(s) -
Andreas Birk,
Kuetgens Ulrich,
Becker Peter
Publication year - 2008
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889808015999
Subject(s) - orientation (vector space) , diffractometer , optics , crystal (programming language) , materials science , physics , geometry , computer science , mathematics , scanning electron microscope , programming language
A fast search method for X‐ray Bragg reflexes of misoriented crystals is presented. The method is also applicable to determine the accuracy of the crystal orientation. This technique is demonstrated by means of a simple setup for Berg–Barrett X‐ray topography, consisting of a rotating sample holder on a two‐circle diffractometer. The imaged area of the topograms is about 1 cm 2 , and the quality is comparable to the topograms taken by white‐beam synchrotron X‐ray topography.