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Anomalous small‐angle scattering from nanoquasicrystalline precipitates in Zr 80 Pt 20 ribbons
Author(s) -
Okuda Hiroshi,
Fukumoto Takefumi,
Saida Junji,
Ochiai Shojiro,
Sasaki Sono,
Masunaga Hiroyasu
Publication year - 2008
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889808015781
Subject(s) - small angle x ray scattering , scattering , materials science , amorphous solid , small angle scattering , annealing (glass) , crystallography , anomalous scattering , quasicrystal , microstructure , analytical chemistry (journal) , optics , chemistry , physics , composite material , chromatography
Anomalous small‐angle X‐ray scattering (ASAXS) profiles of Zr 80 Pt 20 ribbons have been measured at the Zr K absorption edge. By annealing the melt‐spun ribbons at 800 K, well defined SAXS patterns from nanoquasicrystals were observed, although the compositions of the quasicrystals (QC) and the amorphous matrix have previously been reported to be the same. The SAXS intensities were found to show a small anomalous effect at the Zr K edge. Contrast analysis suggested that the origin of the small‐angle scattering is a small compositional fluctuation coupled with a small density difference, which enhances SAXS intensity but reduces the anomalous effect. A constant ASAXS intensity ratio for QC microstructure suggests that the ratio of the composition difference to the density difference between QC and the amorphous matrix is almost constant for the ZrPt ribbons examined here.