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Rotation axis analysis of deformed crystals by X‐rays and electrons
Author(s) -
Borbély András,
Maurice Claire,
Driver Julian H.
Publication year - 2008
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889808015768
Subject(s) - misorientation , electron backscatter diffraction , rotation (mathematics) , kikuchi line , materials science , dislocation , crystallite , diffraction , optics , resolution (logic) , crystallography , condensed matter physics , geometry , electron diffraction , physics , microstructure , grain boundary , chemistry , reflection high energy electron diffraction , mathematics , composite material , metallurgy , artificial intelligence , computer science
X‐ray and electron backscatter diffraction (EBSD) have been applied to investigate misorientation distributions in copper single crystals plastically deformed in single and multiple slip. The misorientation distributions are represented by `rocking curves' about specific rotation axes. Very good agreement for the rocking curves established by the two methods was obtained, despite the large difference between their resolution depths. Following this agreement, a new rotation axis imaging scheme, based on the EBSD data, is proposed in order to visualize the crystallite blocks and characterize the nature of their dislocation boundaries.