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A focusing Laue diffractometer for the investigation of bulk crystals
Author(s) -
Stockmeier Matthias,
Magerl Andreas
Publication year - 2008
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889808012417
Subject(s) - diffractometer , crystallite , anisotropy , detector , materials science , attenuation , sample (material) , energy (signal processing) , optics , crystallography , crystal (programming language) , physics , crystal structure , chemistry , computer science , thermodynamics , quantum mechanics , programming language
A focusing Laue diffractometer for high‐energy X‐rays of up to 300 keV in a laboratory environment is presented. The long attenuation length for X‐ray energies above 50 keV allows for the non‐destructive investigation of structural issues and bulk properties of single crystals. Furthermore, massive sample environments such as high‐temperature furnaces can be used more easily. With an area detector, anisotropic mosaicities or crystallite structure become visible without any rocking movement of the sample.