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Polystyrene‐ b ‐polyisoprene thin films with hexagonally perforated layer structure: quantitative grazing‐incidence X‐ray scattering analysis
Author(s) -
Heo Kyuyoung,
Yoon Jinhwan,
Jin Sangwoo,
Kim Jehan,
Kim KwangWoo,
Shin Tae Joo,
Chung Bonghoon,
Chang Taihyun,
Ree Moonhor
Publication year - 2008
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889808001271
Subject(s) - materials science , polystyrene , copolymer , scattering , stacking , layer (electronics) , x ray , small angle x ray scattering , silicon , crystallography , thin film , composite material , optics , chemistry , nanotechnology , optoelectronics , physics , nuclear magnetic resonance , polymer
Grazing‐incidence X‐ray scattering (GIXS) formulas for hexagonally perforated layer (HPL) structures with ABC and AB stacking sequences were derived, and used in the quantitative analysis of the two‐dimensional GIXS patterns of polystyrene‐ b ‐polyisoprene (PS‐ b ‐PI) diblock copolymer thin films supported on silicon substrates. This quantitative analysis provided detailed information (shape, size and size distribution, packing order, layer packing sequence, and orientation) about the HPL structure of the diblock copolymer films that cannot be easily obtained with conventional X‐ray and neutron scattering techniques or with conventional microscopic methods.