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Quantitative characterization of the contrast mechanisms of ultra‐small‐angle X‐ray scattering imaging
Author(s) -
Zhang F.,
Long G. G.,
Levine L. E.,
Ilavsky J.,
Jemian P. R.
Publication year - 2008
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889808000733
Subject(s) - scattering , small angle x ray scattering , optics , ray tracing (physics) , phase contrast imaging , characterization (materials science) , contrast (vision) , refraction , diffraction , materials science , x ray , physics , phase contrast microscopy
A general treatment of X‐ray imaging contrast for ultra‐small‐angle X‐ray scattering (USAXS) imaging is presented; this approach makes use of phase propagation and dynamical diffraction theory to account quantitatively for the intensity distribution at the detector plane. Simulated results from a model system of micrometre‐sized spherical SiO 2 particles embedded in a polypropylene matrix show good agreement with experimental measurements. Simulations by means of a separate geometrical ray‐tracing method also account for the features in the USAXS images and offer a complementary view of small‐angle X‐ray scattering as a contrast mechanism. The ray‐tracing analysis indicates that refraction, in the form of Porod scattering, and, to a much lesser extent, X‐ray reflection account for the USAXS imaging contrast.