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X‐ray extinction changes due to dislocations
Author(s) -
Masimov M.
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188980704174x
Subject(s) - substructure , dislocation , extinction (optical mineralogy) , scattering , diffraction , yield (engineering) , interpretation (philosophy) , materials science , crystallography , condensed matter physics , statistical physics , physics , optics , chemistry , thermodynamics , structural engineering , computer science , engineering , programming language
A correct interpretation of the diffraction phenomenon in crystals with low dislocation content, for which the kinematical scattering theory does not yield any reasonable results, was carried out by X‐ray extinction treatments. Different approaches to investigating the dislocation‐induced X‐ray extinction changes are reviewed and the applicability of the statistical dynamical theory to analysis of the substructure characteristics of crystals is discussed. A relationship between the scattering amplitudes and the dislocation density in crystals is established by using pair correlation functions. A procedure for determination of the substructure characteristics by means of measurements of the integrated intensities is proposed. The tests illustrate satisfactory agreement of the investigated approaches with experimental data.