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Evidence for the presence of U–Mo–Al ternary compounds in the U–Mo/Al interaction layer grown by thermal annealing: a coupled micro X‐ray diffraction and micro X‐ray absorption spectroscopy study
Author(s) -
Palancher Hervé,
Martin Philippe,
Nassif Vivian,
Tucoulou Remi,
Proux Olivier,
Hazemann JeanLouis,
Tougait Olivier,
Lahéra Eric,
Mazaudier Fabrice,
Valot Carole,
Dubois Sylvie
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807040010
Subject(s) - ternary operation , annealing (glass) , diffraction , materials science , x ray absorption spectroscopy , crystallography , solubility , analytical chemistry (journal) , x ray crystallography , absorption spectroscopy , chemistry , metallurgy , optics , physics , chromatography , computer science , programming language
The systematic presence of the ternary phases U 6 Mo 4 Al 43 and UMo 2 Al 20 is reported in a U–Mo/Al interaction layer grown by thermal annealing. This work shows, therefore, the low Mo solubility in UAl 3 and UAl 4 binary phases; it contradicts the hypothesis of the formation of (U,Mo)Al 3 and (U,Mo)Al 4 solid solutions often admitted in the literature. Using µ‐XAS (micro X‐ray absorption spectroscopy) at the Mo K edge and µ‐XRD (micro X‐ray diffraction), the heterogeneity of the interaction layer obtained on a γ‐U 0.85 Mo 0.15 /Al diffusion couple has been precisely investigated. The UMo 2 Al 20 phase has been identified at the closest location from the Al side. Moreover, µ‐XRD mapping performed on an annealed fuel plate enabled the characterization of the four phases resulting from the γ‐U 0.85 Mo 0.15 /Al and (U 2 Mo + α‐U)/Al interactions. A strong correlation between the concentrations of UAl 4 and UMo 2 Al 20 and those of UAl 3 and U 6 Mo 4 Al 43 has been shown.