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Monte Carlo simulation of the effect of counting losses on measured X‐ray intensities
Journal Of Applied CrystallographyPeer ReviewedIda T.2007Journals
The statistical properties of intensities affected by counting loss based on conventional non‐extended and extended dead‐time models are examined by a Monte Carlo method. It has been confirmed that the variance of the counted pulses for the non‐extended dead‐time model with the rate of generated pulses r and the dead‐time τ is given by , while that for the extended dead‐time model is given by , as proposed by Laundy & Collins [(2003). J. Synchrotron Rad. 10 , 214–218], for the mean values of counted pulses μ non and μ ext , respectively. Practical formulae to estimate the statistical errors of the corrected intensities are also presented.
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