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Monte Carlo simulation of the effect of counting losses on measured X‐ray intensities
Author(s) -
Ida T.
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188980703854x
Subject(s) - monte carlo method , dead time , physics , sigma , synchrotron , mathematics , statistics , optics , quantum mechanics
The statistical properties of intensities affected by counting loss based on conventional non‐extended and extended dead‐time models are examined by a Monte Carlo method. It has been confirmed that the variance of the counted pulses for the non‐extended dead‐time model with the rate of generated pulses r  and the dead‐time τ is given by , while that for the extended dead‐time model is given by , as proposed by Laundy & Collins [(2003). J. Synchrotron Rad. 10 , 214–218], for the mean values of counted pulses μ non and μ ext , respectively. Practical formulae to estimate the statistical errors of the corrected intensities are also presented.

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