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Unambiguous reconstruction of the complex amplitude reflection coefficient of a laterally homogeneous crystal using analyser‐based phase‐contrast imaging
Author(s) -
Vine D. J.,
Paganin D. M.,
Pavlov K. M.,
Podorov S. G.
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807021097
Subject(s) - analyser , optics , amplitude , reflection (computer programming) , diffraction , phase (matter) , crystal (programming language) , homogeneous , arc (geometry) , contrast (vision) , reflection coefficient , physics , materials science , geometry , mathematics , computer science , quantum mechanics , thermodynamics , programming language
A theoretical approach is developed to invert analytically a hard X‐ray analyser‐based phase‐contrast image of a known weak object to recover the complex amplitude reflection coefficient (ARC) of a laterally homogeneous crystal. Numerical simulations test the method to recover the ARC from two systems of interest: a thick perfect crystal and a linearly strained thin film. For the latter model, a kinematical diffraction approximation was used to recover the one‐dimensional deformation profile from the ARC.

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