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Wide‐range three‐dimensional reciprocal‐space mapping: a novel approach applied to organic monodomain thin films
Author(s) -
Lengyel O.,
Haber T.,
Werzer O.,
Hardeman W.,
De Leeuw D. M.,
Wondergem H. J.,
Resel R.
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807018407
Subject(s) - reciprocal lattice , thin film , materials science , crystallite , goniometer , texture (cosmology) , characterization (materials science) , optics , lattice (music) , crystallography , crystal structure , search engine indexing , reciprocal , condensed matter physics , diffraction , nanotechnology , computer science , physics , chemistry , artificial intelligence , linguistics , philosophy , acoustics , metallurgy , image (mathematics)
An X‐ray method is presented to characterize thin films with unknown crystal structure with specific crystal orientations. The method maps large volumes of the reciprocal space by a series of pole‐figure measurements using a standard texture goniometer. The data can be used for lattice indexing and texture evaluation and in subsequent steps for a complete structural thin‐film characterization. The application of the method is demonstrated on an organic monodomain thin film consisting of uniaxially aligned crystallites.