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A program for refinement of lattice parameters based on multiple convergent‐beam electron diffraction patterns
Author(s) -
Morawiec A.
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807018262
Subject(s) - lattice (music) , computer science , software , diffraction , electron diffraction , matching (statistics) , cathode ray , algorithm , electron , computational science , materials science , optics , physics , mathematics , programming language , statistics , quantum mechanics , acoustics
A package of computer programs for refinement of lattice parameters based on convergent‐beam electron diffraction (CBED) patterns has been developed. The package is intended to facilitate the measurement of local elastic strains. The strain or lattice parameters are determined by matching experimental and simulated central disks of CBED patterns. The kinematical simulation is used in the primary fitting. In some cases, further refinement by means of dynamical simulation can be applied. User‐specified strain components, camera lengths and voltage can be fitted. The software is not limited to any particular material or structure. It is capable of simultaneous matching of multiple patterns originating from the same sample location. The use of a number of different strategies allows for the verification of results and for checking their reliability. Operation of the software is controlled via a Windows user interface.