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Indirect two‐trace method to determine a faceted low‐energy interface between two crystallographically correlated crystals
Author(s) -
Zhang Y. D.,
Zhao X.,
Esling C.,
Zuo L.
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807014331
Subject(s) - perpendicular , interface (matter) , trace (psycholinguistics) , plane (geometry) , crystal (programming language) , crystallography , materials science , geometry , condensed matter physics , chemistry , computer science , physics , mathematics , linguistics , philosophy , capillary number , capillary action , composite material , programming language
An indirect two‐trace method to determine interfaces between two crystals with a uniquely defined interface plane is proposed. It involves preparation of only one sample surface, instead of the two perpendicular sample surfaces required by the traditional two‐trace method. By making use of two independent interface trace vectors from one uniquely defined interface and the orientations of their adjacent crystals, the interface plane normal and thus the interface plane in the two correlated crystal systems can be determined through numerical calculations concerning coordinate system change. The new method is widely applicable to identify any uniquely defined and reproducible interfaces between crystallographically correlated crystals, even slip systems, provided that they are microscopically visible and crystallographically of the same nature. It can simplify the experimental procedure, increase the determination accuracy and broaden the scope of interface studies.