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Characterization of two‐dimensional ultra‐small‐angle X‐ray scattering apparatus for application to rubber filled with spherical silica under elongation
Author(s) -
Shinohara Yuya,
Kishimoto Hiroyuki,
Inoue Katsuaki,
Suzuki Yoshio,
Takeuchi Akihisa,
Uesugi Kentaro,
Yagi Naoto,
Muraoka Kiyoshige,
Mizoguchi Tetsuo,
Amemiya Yoshiyuki
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807011697
Subject(s) - small angle x ray scattering , materials science , natural rubber , elongation , carbon black , aggregate (composite) , composite material , scattering , characterization (materials science) , nanotechnology , optics , ultimate tensile strength , physics
Two‐dimensional ultra‐small‐angle X‐ray scattering (2D‐USAXS) apparatus at SPring‐8 has been characterized. 2D‐USAXS is a promising tool to study the structural change of the hierachical aggregate structure of fillers such as carbon black and silica particles in rubber. The aggregate structure of fillers is key to understanding the reinforcement effects which fillers show in rubber. We have applied 2D‐USAXS to rubber filled with spherical silica particles and proved it to be a powerful technique.