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Electron density map using multiple scattering in grazing‐incidence small‐angle X‐ray scattering
Author(s) -
Lee Byeongdu,
Park Insun,
Park Haewoong,
Lo ChiehTsung,
Chang Taihyun,
Winans Randall E.
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807011399
Subject(s) - grazing incidence small angle scattering , scattering , small angle x ray scattering , materials science , electron density , diffraction , optics , biological small angle scattering , small angle scattering , x ray , x ray crystallography , electron , physics , small angle neutron scattering , inelastic scattering , x ray raman scattering , neutron scattering , quantum mechanics
The electron density map of a block copolymer thin film having the hexagonally perforated layer (HPL) structure was directly obtained from the measured grazing‐incidence small‐angle X‐ray scattering (GISAXS) pattern, exploiting the multiple‐scattering phenomena present in GISAXS. It is shown that GISAXS is in principle equivalent to three‐beam diffraction, which has been used to extract phases of diffraction peaks. In addition, X‐ray reflectivity analysis has been performed which, when combined with the GISAXS results, provides full details of the HPL structure.