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Low‐background single‐crystal silicon sample holders for neutron powder diffraction
Author(s) -
Potter M.,
Fritzsche H.,
Ryan D. H.,
Cranswick L. M. D.
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807011387
Subject(s) - scattering , neutron diffraction , materials science , diffraction , silicon , neutron , optics , bragg's law , neutron scattering , single crystal , yield (engineering) , matrix (chemical analysis) , bragg peak , sample (material) , small angle neutron scattering , crystal (programming language) , crystallography , biological small angle scattering , molecular physics , optoelectronics , physics , chemistry , composite material , nuclear physics , computer science , beam (structure) , programming language , thermodynamics
Neutron diffraction measurements on weakly scattering or highly absorbing samples may demand custom mounting solutions. Two low‐background sample holders based on inexpensive single‐crystal silicon are described. One uses a conventional cylindrical geometry and is optimized for weakly scattering materials, while the other has a large‐area flat‐plate geometry and is designed for use with highly absorbing samples. Both holders yield much lower backgrounds than more conventional null‐matrix or null‐scattering materials and are essentially free from interfering Bragg peaks.