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Structure and dynamics of thin polymer films using synchrotron X‐ray scattering
Author(s) -
Jiang Zhang,
Kim Hyunjung,
Lee Heeju,
Lee Young Joo,
Jiao Xuesong,
Li Chunhua,
Lurio Laurence B.,
Hu Xuesong,
Lal Jyotsana,
Sandy Alec,
Narayanan Suresh,
Rafailovich Miriam,
Sinha Sunil K.
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807007996
Subject(s) - scattering , materials science , radius of gyration , capillary wave , synchrotron , surface tension , polystyrene , thin film , surface forces apparatus , monolayer , bilayer , viscoelasticity , optics , polymer , composite material , chemistry , thermodynamics , physics , nanotechnology , membrane , biochemistry
Recent measurements of the scattering function and of the dynamics of surface and interfacial fluctuations in thin supported molten films and bilayers using synchrotron X‐ray diffuse scattering and photon correlation spectroscopy in reflection geometry are reported. The results for monolayer films thicker than four times of the radius of gyration of polystyrene show behavior of normal over‐damped capillary waves expected for the surface fluctuations of a viscous liquid. However, thinner films show deviations indicating the need to account for viscoelasticity. The theory has been extended to the surface and interfacial modes in a bilayer film system. The results are discussed in terms of surface tension, viscosity and shear modulus. Also recent experiments to measure the isothermal compressibility of supported polystyrene films by studying `bulk' scattering from the interior of the films is discussed.