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Two‐dimensional small‐angle X‐ray scattering from as‐grown and heat‐treated synthetic quartz
Author(s) -
Guzzo Pedro L.,
Shinohara Armando H.,
Funari Sérgio S.,
Daito Shigeo,
Santos Anastacia E. F.
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807002609
Subject(s) - small angle x ray scattering , scattering , quartz , anisotropy , bar (unit) , materials science , crystallography , crystal (programming language) , x ray , intensity (physics) , chemistry , analytical chemistry (journal) , optics , physics , composite material , chromatography , meteorology , computer science , programming language
The small‐angle X‐ray scattering (SAXS) in as‐grown and heat‐treated quartz crystals was investigated as a function of the azimuth angle around the primary beam. For this, samples parallel to (100) were extracted from Z‐ and −X‐growth sectors of a synthetic quartz bar which had the OH content evaluated by infrared spectroscopy (IRS). In addition, SAXS and IRS were independently recorded as a function of heating temperature. As a result, the two‐dimensional SAXS images revealed an anisotropic pattern randomly decorated by low‐intensity Kossel lines. The intensities were projected along specific directions or were axially integrated around the primary beam. It was observed that the Porod invariant ( Q ) increased and the Kossel lines moved slightly to higher q values with increasing temperature. The effect of the sample orientation on the Q value and the lack of a clear relationship between Q and OH content suggested that the diffuse scattering due to the periodicity of the crystal lattice played an important role in the small‐angle scattering of quartz. The net scattering intensities produced by heat‐treatment at 873 K were attributed to molecular water aggregates created by the diffusion of as‐grown OH defects.