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Reduction of two‐dimensional small‐ and wide‐angle X‐ray scattering data
Author(s) -
Boesecke Peter
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807001100
Subject(s) - normalization (sociology) , data reduction , detector , scattering , optics , physics , synchrotron radiation , reduction (mathematics) , parametrization (atmospheric modeling) , computational physics , small angle scattering , computer science , mathematics , geometry , sociology , anthropology , data mining , radiative transfer
At the beamlines ID01 and ID02 of the European Synchrotron Radiation Facility in Grenoble, France, position‐sensitive detectors for time‐resolved small‐ and wide‐angle X‐ray scattering experiments are in use. The applied data reduction method has never been described comprehensively. This article outlines the parametrization of the raw data and introduces the programs developed for this purpose. Data reduction in the sense of this article means all steps between detector readout and normalization to absolute scattering intensities. This includes all corrections that can be made without any specific knowledge of the sample, e.g. detector dark‐image correction, division by a flat‐field and intensity normalization. Processed data are either two‐ or one‐dimensional. Optionally, statistical errors can be propagated through the calculations.