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Small‐angle X‐ray scattering measurements of expanded fluid Se in the semiconductor–metal transition region using synchrotron radiation
Author(s) -
Inui Masanori,
Matsuda Kazuhiro,
Tamura Kozaburo,
Satoh Kohei,
Sobajima Atsushi,
Tada Hirotoshi
Publication year - 2007
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889807000751
Subject(s) - synchrotron radiation , scattering , semiconductor , synchrotron , materials science , x ray , transition metal , radiation , high energy x rays , small angle scattering , transition radiation , small angle x ray scattering , atomic physics , physics , optics , chemistry , optoelectronics , biochemistry , beam (structure) , beamline , catalysis
Small‐angle X‐ray scattering measurements for expanded fluid Se were carried out up to the semiconductor–metal transition region at high temperature and high pressure. A broad peak appears in the small‐angle X‐ray scattering profiles in the temperature range 1273 to 1773 K at 60 MPa, which suggests a correlation length of 50 Å. We fitted the patterns using a model function proposed by Teubner & Strey [ J. Chem. Phys. (1987), 87 , 3195–3200] and obtained two characteristic lengths, the domain size of the dense and rare regions, and the correlation length concerning their boundary. The present results suggest peculiar density fluctuations accompanying the SC‐M transition in fluid Se consisting of polymeric molecules.