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XRD2DScan : new software for polycrystalline materials characterization using two‐dimensional X‐ray diffraction
Author(s) -
RodriguezNavarro Alejandro B.
Publication year - 2006
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889806042488
Subject(s) - crystallite , software , detector , diffraction , computer science , process (computing) , characterization (materials science) , data processing , materials science , optics , crystallography , physics , database , chemistry , telecommunications , operating system
XRD2DScan is a Windows application for displaying and analyzing two‐dimensional X‐ray diffraction patterns collected with an area detector. This software allows users to take full advantage of diffractometers that are equipped with an area detector but that cannot readily process the information contained in diffraction patterns from polycrystalline materials. XRD2DScan has many capabilities for generating different types of scans (2θ scan, ψ scan, d spacing versus ψ angle), which allows users to extract the maximum amount of information from two‐dimensional patterns. Analyses of multiple data files can be fully automated using batch processing. The use of the software is illustrated through several examples.