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Three‐dimensional birefringence imaging with a microscope tilting stage. II. Biaxial crystals
Author(s) -
Pajdzik L. A.,
Glazer A. M.
Publication year - 2006
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188980604009x
Subject(s) - birefringence , crystallite , orientation (vector space) , materials science , principal axis theorem , optics , resolution (logic) , microscope , optical microscope , crystallography , geometry , scanning electron microscope , composite material , physics , chemistry , mathematics , computer science , metallurgy , artificial intelligence
The technique enables precise three‐dimensional birefringence information of optically biaxial materials to be obtained. Equations derived here describe a mathematical model of the tilting‐stage system for such crystals in any general orientation. This leads to precise values of the three principal birefringences and the optical orientation. The method is also able to obtain information on preferred orientation in a biaxial polycrystalline material, providing comprehensive information on both optical orientation of crystallites and spatial resolution. In addition, an unknown crystalline material may be identified, or at least classified within a specific group of crystalline materials.