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Thin film analysis by X‐ray scattering. By Mario Birkholz, with contributions by P. F. Fewster and C. Genzel. Pp. xxii+356. Weinheim: Wiley‐VCH Verlag GmbH Co., 2005. Price (hardcover) EUR 119, SFR 188. ISBN‐10: 3‐527‐31052‐5; ISBN‐13: 978‐3‐527‐31052‐4.
Author(s) -
Chateigner Daniel
Publication year - 2006
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889806034698
Subject(s) - crystallography , materials science , chemistry , polymer science
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