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Silver behenate as a calibration standard of grazing‐incidence small‐angle X‐ray scattering
Author(s) -
Lee Byeongdu,
Lo ChiehTsung,
Seifert Soenke,
Winans Randall E.
Publication year - 2006
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889806031244
Subject(s) - grazing incidence small angle scattering , scattering , optics , total external reflection , materials science , refraction , calibration , refractive index , small angle x ray scattering , reflection (computer programming) , incidence (geometry) , range (aeronautics) , physics , small angle neutron scattering , composite material , quantum mechanics , computer science , programming language , neutron scattering
Grazing‐incidence small‐angle X‐ray scattering (GISAXS) patterns of a silver behenate composite film, which has a typical layered structure, are described. The peak position of the film in the GISAXS pattern was varied depending on the incident angle, which was well described by taking into account the refraction and the reflection effects. Since the refractive index of samples depends on sample preparation, it is recommended that the measurement of silver behenate as a standard be done in conventional transmission mode to avoid any complexity.