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SXD – the single‐crystal diffractometer at the ISIS spallation neutron source
Author(s) -
Keen David A.,
Gutmann Matthias J.,
Wilson Chick C.
Publication year - 2006
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889806025921
Subject(s) - spallation neutron source , diffractometer , spallation , neutron source , neutron diffraction , reciprocal lattice , neutron , single crystal , detector , physics , materials science , diffraction , optics , nuclear physics , nuclear magnetic resonance , scanning electron microscope
SXD, the single‐crystal diffractometer at the ISIS spallation neutron source, uses an array of two‐dimensional position‐sensitive detectors and the neutron time‐of‐flight technique to measure diffraction data throughout very large volumes of reciprocal space for each fixed orientation of a single‐crystal sample. This paper describes SXD in detail, following major improvements to the instrument. Particular emphasis is placed on the range of science possible, using recent results as examples, and the opportunities for future experiments.