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Energy spectrometer on a diffractometer using a charge‐coupled device X‐ray detector
Author(s) -
Abe Hiroshi,
Saitoh Hiroyuki,
Nakao Hironori,
Ito Kazuki,
Ohshima Kenichi
Publication year - 2006
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889806023144
Subject(s) - spectrometer , diffractometer , beamline , detector , analyser , optics , highly oriented pyrolytic graphite , physics , diffraction , x ray detector , spectral line , materials science , graphite , beam (structure) , scanning electron microscope , composite material , astronomy
A charge‐coupled device (CCD) X‐ray detector for inelastic X‐ray scattering was installed at beamline BL‐4C of the Photon Factory at the High Energy Accelerator Research Organization in Japan. A wavelength‐dispersive X‐ray spectrometer was mounted on a six‐circle diffractometer. Energy spectra were obtained by the CCD X‐ray detector and a curved highly oriented pyrolytic graphite analyser. By the combination of energy spectroscopy and diffraction, simultaneous real‐time data acquisition of both the momentum and the energy transfer was performed.

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