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Three‐dimensional birefringence imaging with a microscope tilting‐stage. I. Uniaxial crystals
Author(s) -
Pajdzik L. A.,
Glazer A. M.
Publication year - 2006
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889806007758
Subject(s) - birefringence , uniaxial crystal , materials science , microscope , optical axis , optics , orientation (vector space) , crystallite , refractive index , sign (mathematics) , optical microscope , polarized light microscopy , scanning electron microscope , optoelectronics , composite material , geometry , physics , mathematics , mathematical analysis , metallurgy , lens (geology)
The development of a microscope tilting‐stage suitable for use with birefringence imaging is described, thus enabling precise three‐dimensional birefringence information of uniaxial crystals to be obtained. Equations have been derived for uniaxial crystals in any orientation. The technique enables precise values of the birefringence Δ n = n e − n o (difference between extraordinary and ordinary refractive index) and orientation of the optic axis to be obtained. The sign of the optical indicatrix may be unambiguously identified. The method is also able to obtain information on preferred orientation in a polycrystalline material. In addition to this, an unknown crystalline material may be identified, or at least classified within a specific group of crystalline materials.