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Microradian X‐ray diffraction in colloidal photonic crystals
Author(s) -
Thijssen J. H. J.,
Imhof A.,
Petukhov A. V.,
't Hart D. C.,
Dolbnya I. P.,
Van Blaaderen A.,
Snigirev A.,
Snigireva I.,
Moussaïd A.
Publication year - 2006
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889805041774
Subject(s) - diffraction , optics , bragg's law , resolution (logic) , materials science , synchrotron radiation , photonics , colloidal crystal , detector , synchrotron , colloid , angular resolution (graph drawing) , scattering , photonic crystal , x ray crystallography , physics , chemistry , mathematics , combinatorics , artificial intelligence , computer science
Ultra‐high‐resolution small‐angle X‐ray scattering in various colloidal photonic crystals is reported. It is demonstrated that an angular resolution of about two microradians is readily achievable at a third‐generation synchrotron source using compound refractive optics. The scheme allows fast acquisition of two‐dimensional X‐ray diffraction data and can be realised at sample–detector separations of only a few metres. As a result, diffraction measurements in colloidal crystals with interplanar spacings larger than a micrometre, as well as determination of the range of various order parameters from the width of the Bragg peaks, are made possible.