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Energy separation of neutrons scattered at small angles from silicon using time‐of‐flight techniques
Author(s) -
Cheung J. Y.,
May R. P.,
Stewart R. J.
Publication year - 2006
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889805033698
Subject(s) - time of flight , neutron , scattering , silicon , spectrometer , neutron scattering , small angle neutron scattering , neutron temperature , physics , biological small angle scattering , neutron time of flight scattering , phonon , optics , materials science , nuclear physics , atomic physics , condensed matter physics , optoelectronics
The time‐of‐flight technique is used on a small‐angle neutron scattering instrument to separate the energies of the scattered neutrons, in order to determine the origin of the temperature‐dependent scattering observed from silicon at Q > ∼0.1 Å −1 . A quantitative analysis of the results in comparison with the phonon dispersion curves, determined by Dolling using a triple‐axis neutron spectrometer, shows that the temperature‐dependent scattering can be understood in terms of Umklapp processes whereby neutrons gain energy from phonons.