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Comments on `On the reliability of fully automatic indexing of electron diffraction patterns obtained in a transmission electron microscope' by Morawiec & Bouzy (2006)
Author(s) -
Rauch Edgar F.,
Dupuy Laurent
Publication year - 2006
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889805033157
Subject(s) - search engine indexing , electron diffraction , transmission electron microscopy , electron , ambiguity , reliability (semiconductor) , diffraction , electron microscope , selected area diffraction , computer science , transmission (telecommunications) , optics , crystallography , materials science , physics , computational physics , chemistry , artificial intelligence , quantum mechanics , telecommunications , programming language , power (physics)
The limitation of automatic indexing of electron diffraction patterns raised by Morawiec & Bouzy [ (2006). J. Appl. Cryst.39, 101103 ] is discussed. The theoretical problem related to the famous 180° ambiguity may be surmounted by adequate technical improvements. Three solutions to avoid misindexing are briefly described.