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Determination of crystal orientation by an area‐detector image for surface X‐ray diffraction
Author(s) -
Yashiro Wataru,
Kusano Shuji,
Miki Kazushi
Publication year - 2005
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889805001536
Subject(s) - diffraction , detector , orientation (vector space) , optics , crystal (programming language) , matrix (chemical analysis) , sample (material) , surface (topology) , projection (relational algebra) , truncation (statistics) , x ray , materials science , x ray crystallography , physics , geometry , mathematics , computer science , algorithm , statistics , composite material , thermodynamics , programming language
A new method of calculating the crystal orientation matrix ( U matrix) of a specified sample using two‐dimensional X‐ray diffraction spots that are recorded on an area detector is presented. In this way, the U matrix is calculated using at least three two‐dimensional diffraction spots of known two‐dimensional indices, which provide the projection of the crystal truncation rod onto the detector. The method, in the case of surface X‐ray diffraction measurements with an area detector, enables easier and faster sample alignment than the conventional method to determine the U matrix.