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X‐ray scattering from semiconductors . 2nd edition. By Paul F. Fewster. World Scientific Publishing, 2003, pp. 316. Price USD 76, GBP 56. ISBN 1 86094 360 8.
Author(s) -
P. Paufler
Publication year - 2004
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188980402059x
Subject(s) - scientific publishing , publishing , engineering physics , semiconductor , scattering , materials science , library science , physics , political science , optics , optoelectronics , computer science , law