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Characterization and modelling of germanium assembled crystals for the diffraction of thermal neutrons
Author(s) -
Alianelli Lucia,
Sánchez del Río Manuel,
Felici Roberto
Publication year - 2004
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889804015390
Subject(s) - germanium , monte carlo method , neutron diffraction , neutron , materials science , synchrotron , characterization (materials science) , diffraction , reverse monte carlo , optics , crystal (programming language) , synchrotron radiation , computational physics , physics , crystallography , nuclear physics , chemistry , optoelectronics , computer science , silicon , statistics , mathematics , programming language
Two assembled germanium crystals, produced for use as neutron monochromators, are characterized by means of neutron and X‐ray diffraction. The neutron and synchrotron experimental data (reflectivity profiles and topographs) are compared with calculations based on analytical models and Monte Carlo simulations. Our results show the limits of the standard theories and indicate that full Monte Carlo simulations can be a valid tool for interpreting real crystal reflectivities.