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The elimination of the influence of ambient environmental effects on the structure of `inert' polymers
Author(s) -
Rosa Luis G.,
Jacobson P. A.,
Lemoine Raymond,
Dowben P. A.
Publication year - 2004
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889804012026
Subject(s) - inert , polymer , inert gas , moisture , thin film , materials science , diffraction , water vapor , chemical engineering , chemistry , nanotechnology , organic chemistry , composite material , optics , physics , engineering
The construction and use of a vacuum chamber suitable for conventional X‐ray diffraction has revealed the influence of the ambient environment, including moisture, on the bulk structure of very thin polymer films. It is concluded that studies of thin film organic systems, even those thought not to be perturbed by ambient water vapor and other contaminants, may benefit from undertaking some studies in such small sample vacuum chambers.

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