Premium
SAXS of self‐assembled oriented lamellar nanocomposite films: an advanced method of evaluation
Author(s) -
Ruland Wilhelm,
Smarsly Bernd
Publication year - 2004
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889804011288
Subject(s) - lamellar structure , materials science , small angle x ray scattering , nanocomposite , stacking , scattering , lamellar phase , lattice (music) , optics , composite material , physics , nuclear magnetic resonance , acoustics
Oriented lamellar nanocomposites formed of alternating organic and inorganic layers were prepared by evaporation‐induced self‐assembly and studied by small‐angle X‐ray scattering in symmetrical and asymmetrical reflection. Analytical expressions were used for a quantitative fit of the experimental data. The fitting procedure leads to a comprehensive characterization of the lamellar two‐phase system in terms of the average thicknesses of the lamellae, the average period and the corresponding variances, using both the stacking model and the lattice model. Furthermore, the width of the domain boundary and the preferred orientation were determined. No significant differences could be found between the parameters obtained for the two models, but the lattice model leads to a better curve fitting. The effects of finite stack height and of instrumental broadening were found to be indistinguishable.