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A `beam‐selection' high‐resolution X‐ray diffractometer
Author(s) -
Fewster Paul F.
Publication year - 2004
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889804011094
Subject(s) - diffractometer , collimated light , resolution (logic) , optics , bent molecular geometry , materials science , crystal (programming language) , instrumentation (computer programming) , sample (material) , perfect crystal , crystallography , physics , chemistry , computer science , laser , scanning electron microscope , artificial intelligence , composite material , thermodynamics , programming language , operating system
A new diffractometer that can be described as a high‐intensity low‐background high‐resolution diffractometer for analysing perfect, nearly perfect and highly imperfect materials on a routine basis is presented. The instrumentation is very simple and uncomplicated, yet the way in which it works is less obvious. The sample requires minimal sample alignment, the resolution can be adjusted to optimize the experiment and the wavelength dispersion can be controlled. This diffractometer can produce near perfect profiles from bent and imperfect samples. The illuminated area can easily be varied from greater than 3 mm down to 50 µm diameter, offering great opportunities in microdiffraction with high resolution. The instrument appears similar to a double‐crystal diffractometer in reverse, i.e. the sample and collimating crystal of a conventional double‐crystal diffractometer are reversed; however, the concept is quite different.