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Electron diffraction of thin‐film pentacene
Author(s) -
Wu J. S.,
Spence J. C. H.
Publication year - 2004
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889803025093
Subject(s) - pentacene , electron diffraction , thin film , diffraction , materials science , crystallography , electron microscope , phase (matter) , reflection high energy electron diffraction , crystal structure , selected area diffraction , molecule , chemistry , optics , nanotechnology , physics , thin film transistor , organic chemistry , layer (electronics)
The structure of pentacene thin films deposited on NaCl substrates have been studied by electron diffraction. The lattice parameters of a `thin film' phase [ a = 6.1 (1), b = 7.6 (1), c = 15.3 (3) Å, α = 81.0 (16), β = 85.0 (17), γ = 89.5 (9)°] were determined using a series of diffraction patterns obtained by tilting the crystal in the electron microscope. This phase has a (001) d spacing of 15.1 (3) Å. The packing of molecules in the structure is discussed.