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CIF applications. XII. Inspecting Rietveld fits from pdCIF: pdCIFplot
Author(s) -
Toby Brian H.
Publication year - 2003
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889803016789
Subject(s) - rietveld refinement , computer science , computer graphics (images) , engineering drawing , programming language , crystallography , chemistry , engineering , crystal structure
A description is given of the pdCIFplot program. This program is used to inspect the quality of fits obtained from Rietveld refinements where the results are communicated in pdCIF files. The program runs on almost all contemporary operating systems.