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A method of precise misorientation determination
Author(s) -
Morawiec A.
Publication year - 2003
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889803015905
Subject(s) - misorientation , resolution (logic) , accuracy and precision , sample (material) , kikuchi line , optics , set (abstract data type) , materials science , algorithm , computer science , physics , mathematics , diffraction , electron diffraction , artificial intelligence , statistics , reflection high energy electron diffraction , microstructure , grain boundary , metallurgy , thermodynamics , programming language
A method that improves the accuracy of misorientations determined from Kikuchi patterns is described. It is based on the fact that some parameters of a misorientation calculated from two orientations are more accurate than other parameters. A procedure which eliminates inaccurate elements is devised. It requires at least two foil inclinations. The quality of the approach relies on the possibility to set large sample‐to‐detector distances and the availability of good spatial resolution of transmission electron microscopy. Achievable accuracy is one order of magnitude better than the accuracy of the standard procedure.