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Investigation of distorted subsurface layers of thick perfect crystals
Author(s) -
Aboyan A. O.,
Drmeyan H. R.
Publication year - 2003
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188980301481x
Subject(s) - crystal (programming language) , scattering , reflection (computer programming) , perfect crystal , optics , intensity (physics) , character (mathematics) , absorption (acoustics) , materials science , beam (structure) , divergence (linguistics) , physics , geometry , composite material , linguistics , philosophy , mathematics , bent molecular geometry , computer science , programming language
The effect of crystal surface defects on the intensity of X‐ray scattering has been investigated. It was found that in the presence of distorted subsurface layers, the occurrence of reflection structures (fine lines) depended on the divergence and monochromaticity of the incident beam, as well as on the absorption and character of X‐ray scattering on distorted layers and in the main bulk (perfect part) of the crystal.