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Image analysis of transmission electron micrographs of semicrystalline polymers: a comparison with X‐ray scattering results
Author(s) -
Haubruge H. G.,
Gallez X. A.,
Nysten B.,
Jonas A. M.
Publication year - 2003
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889803009087
Subject(s) - reciprocal lattice , scattering , micrograph , small angle x ray scattering , amorphous solid , materials science , crystallinity , polymer , transmission electron microscopy , tacticity , electron micrographs , optics , electron scattering , molecular physics , electron microscope , crystallography , diffraction , scanning electron microscope , composite material , physics , chemistry , nanotechnology , polymerization
Image analysis of semi‐crystalline polymer systems in reciprocal space allows quantitative measurement of characteristic periodicities of the material. This paper proposes numerical techniques for the computation of power spectral densities (PSD) and correlation functions, appropriate to this objective, along with a theoretical justification. These methods are applied to transmission electron micrographs of isotactic polypropylene (iPP) and poly(ethylene terephthalate) (PET). Measured characteristic periodicities arise from electronic contrast between crystalline and stained amorphous phases. They correlate well with results obtained by small‐angle X‐ray scattering (SAXS) on non‐stained samples.