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Recent experiments on a small‐angle/wide‐angle X‐ray scattering beam line at the ESRF
Author(s) -
Bras W.,
Dolbnya I.P.,
Detollenaere D.,
Van Tol R.,
Malfois M.,
Greaves G.N.,
Ryan A.J.,
Heeley E.
Publication year - 2003
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s002188980300400x
Subject(s) - beamline , interfacing , small angle x ray scattering , optics , synchrotron radiation , beam (structure) , scattering , line (geometry) , materials science , detector , high energy x rays , small angle scattering , synchrotron , sample (material) , physics , computer science , geometry , mathematics , computer hardware , thermodynamics
Recent results using a new combined small‐angle/wide‐angle X‐ray scattering (SAXS/WAXS) beam line at the European Synchrotron Radiation Source (ESRF) will be presented. This beam line is specifically designed to be able to handle complicated sample environments required to perform time‐resolved experiments mimicking processing conditions used in material science. Besides the attention that has been given to the interfacing of these sample environments to the beam line data acquisition system also the developments in detector technology will be discussed. The influence that a high count rate and low noise WAXS detector can have on the accuracy of experimental results in polymer crystallisation will be shown. It is shown that it is feasible to detect crystalline volume fractions as low as 10 ‐3 ‐10 ‐4 in polymeric systems.