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Characterization of materials of industrial importance using small‐angle scattering techniques
Author(s) -
Thiyagarajan P.
Publication year - 2003
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889803001882
Subject(s) - small angle neutron scattering , small angle x ray scattering , materials science , neutron scattering , scattering , colloid , polymer , lanthanide , small angle scattering , phase (matter) , chemical engineering , chemical physics , chemistry , optics , composite material , organic chemistry , ion , physics , engineering
Small angle scattering (SAS) techniques using either X‐rays or neutrons are versatile tools for deriving information on the size, morphology and dispersion of colloidal systems in complex materials of industrial importance. The processes such as self‐assembly, aggregation, crystallization and phase separation can be studied using SAS techniques at relevant conditions. The difference in the interaction of X‐rays and neutrons with matter enables complementary contrast variation studies using SANS and anomalous SAXS (in the presence of metals) on multi‐component materials with hierarchical structures. In this paper we present results from small angle scattering studies on a number of systems of industrial importance including, temperature/pressure/shear dependent phase behaviour of pluronics in aqueous media, solution structures of aggregates/polymers of metal‐extractant complexes, third phase formation of metal‐extractant complexes in organic phase, encapsulation of lanthanides and actinides in porous silica and phase separation and nanocrystallization in bulk metallic glasses.