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Characterization of heterogeneities in new‐generation synthetic quartz crystals by small‐angle X‐ray scattering
Author(s) -
Guzzo P. L.,
Shinohara A. H.,
Pasquali M. A.,
Gusken E.,
Suzuki C.K.,
Azevedo W. M.,
Mikawa Y.
Publication year - 2003
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889803001791
Subject(s) - scattering , small angle x ray scattering , quartz , radius of gyration , characterization (materials science) , gyration , radius , materials science , x ray , bar (unit) , analytical chemistry (journal) , spectroscopy , crystallography , chemistry , molecular physics , optics , polymer , physics , nanotechnology , geometry , chromatography , mathematics , computer security , quantum mechanics , meteorology , computer science , composite material
Small‐angle X‐ray scattering was employed to investigate heterogeneities in growth sectors of a large Z‐bar synthetic quartz. The measurements were performed in as‐grown and heat‐treated samples. As a result, X‐ray scattering was observed in all samples. The Guinier approximation revealed a polydispersive distribution of heterogeneities in as‐grown samples with a radius of gyration ranging from 80 to 250 Å. Infrared spectroscopy and X‐ray fluorescence analysis were used to elucidate the nature of these heterogeneities. Considerable variations in the intensity of scattered X‐rays due to heat treatments were only noticed in growth sectors with high OH‐content. The results suggest that tiny aggregates of molecular water are the main reason for the scattering patterns observed in the range 0.006 < q < 0.1 Å ‐1 .