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Energy‐dispersive X‐ray diffraction on thin films and its application to superconducting samples
Author(s) -
Rossi Albertini V.,
Paci B.,
Meloni S.,
Caminiti R.,
Bencivenni L.
Publication year - 2003
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889802018319
Subject(s) - diffraction , substrate (aquarium) , thin film , materials science , laser ablation , optics , superconductivity , bragg's law , x ray , layer (electronics) , bragg peak , x ray crystallography , displacement (psychology) , laser , condensed matter physics , physics , composite material , nanotechnology , beam (structure) , psychology , oceanography , geology , psychotherapist
Energy‐dispersive X‐ray diffraction is applied to investigate double‐layer PBCO/YBCO thin films deposited by laser ablation. The merits of this technique for the structural study of films are discussed. It is shown that the rocking curves of the Bragg reflections of a film along the c direction can be simultaneously collected, allowing the accurate evaluation of its angular spread. A systematic displacement of the rocking curves of the film with respect to those of the substrate was found, revealing a slight divergence of the growth direction from the normal to the substrate surface.