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Analysis of asymmetric broadening of X‐ray diffraction peak profiles caused by randomly distributed polarized dislocation dipoles and dislocation walls
Author(s) -
Groma I.,
Monnet G.
Publication year - 2002
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889802010695
Subject(s) - asymmetry , diffraction , dislocation , dipole , condensed matter physics , polarization (electrochemistry) , materials science , x ray crystallography , optics , crystallography , molecular physics , physics , chemistry , quantum mechanics
The problem of asymmetric X‐ray diffraction peak broadening caused by dislocations is investigated. The leading term responsible for the asymmetry of the intensity distribution is calculated for randomly distributed polarized dipoles and dipole walls. It is found that the polarization structure of a dislocation ensemble can be determined from the diffraction order dependence of the profile asymmetry.