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On the intrinsic hook effect associated with pseudo‐Voigt profiles
Author(s) -
Dasgupta Prabal
Publication year - 2002
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889801021203
Subject(s) - full width at half maximum , voigt profile , hook , line width , physics , optics , spectral line , structural engineering , astronomy , engineering
An intrinsic hook effect was always found to be associated with pseudo‐Voigt (p‐V) profiles when η was less than 0.328 and the FWHM was small (∼0.02°), where η is the fraction of the Cauchy component and FWHM is the full width at half‐maximum. The applicability of the Warren–Averbach (WA) analysis for the case of p‐V profiles was thoroughly studied and it was found that a p‐V profile with η values ranging from 0 to 1 can be safely subjected to WA analysis, provided that the FWHM of the profile is large enough (2 w ≃ 0.378°).