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Transmission electron microscopy and diffractometry of materials. By B. Fultz and J. M. Howe. pp. xix + 748pp. Heidelberg: Springer‐Verlag, 2001. Price DM 179.00, US $89.95. ISBN 3‐540‐67841‐7.
Author(s) -
Dorset Douglas L.
Publication year - 2002
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s0021889801020532
Subject(s) - transmission electron microscopy , materials science , crystallography , chemistry , nanotechnology